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Study of Environmental Forensic Technology Development (2/4)-IC, LC/MS/MS and LC/Q-TOF Forensic Tech

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The purpose of this study was to develop the IC、LC/MS/MS and LC/Q-TOF forensic technology for identification and characterization of sludge in variety of industry. With the combination of XRF, XRD, SEM/EDX and GC/MS quick screening approaches, this study developed novel analysis approaches to identify compositions of organic and/or inorganic compound features in industrial sludge. In the meantime, this study collected the related information of industrial sludge to establish the sludge features index and identification procedures applying to our country. According to review the published literatures about the analysis approaches of IC、LC/MS/MS and LC/Q-TOF applying to the pollutants detection in environmental samples, food or personal care medicine etc., this study put the efforts on developing samples pretreatment and purification processes, optimizing analysis conditions, and data interpretation The sludge collected from solar industries, bare printed circuit boards manufacturing and electronic passive devices manufacturing were analyzed, and the composition of organic and/or inorganic compound features in sludge were used to establish the database. Based on the results of the above analyses, the sludge characteristics of solar energy manufacturing, bare printed circuit boards manufacturing and electronic passive devices manufacturing can be summarized as follows: 1. Solar Energy manufacturing  XRF:Silicon and Calcium  EDX:Fluorine  XRD:CaF2, and crystal of SiC  GC/MS: 9-Octadecenamide, (Z)-  LC/Q-TOF:m/z=282.221, C18H36NO 2. Bare printed circuit boards manufacturing  XRF:Copper, Nickel, Manganese and Tin  GC/MS:9-Octadecenamide, (Z)-, 1,2,5-Thiadiazole, Ethanol, 2-(2-ethoxyethoxy)-(EO surfactant), Benzenamine, Benzenesulfonamide, and amide compounds.  LC/Q-TOF:m/z=256.263 C16H34NO, m/z=278.211 C17H28NO2, m/z=264.196 C16H26NO2, m/z=358.266 C24H28N3, m/z=372.244 C25H30N3, EO, PO etc. compounds.。 3. Electronic passive devices manufacturing  XRF:Titanium, Barium, and Zirconium  XRD:crystal of BaTiO3  GC/MS:9-Octadecenamide, (Z)-、1,2,5-Thiadiazole、Ethanol, 2-(2-ethoxyethoxy)-(EO surfactant), Di-n-octyl phthalate、Bis(2-ethylhexyl) phthalate etc. DOPs.  LC/Q-TOF:m/z=331.100 C21H16ClN2, m/z=600~900 NPnEO, m/z=304.300 C21H38N, m/z=332.232 C23H42N, m/z=360.363 C25H46N, m/z=425.289 C19H41N2O8, m/z=391.285 C24H39O4(Bis(2-ethylhexyl) phthalate (DEHP).
Keyword
Identification and characterization of sludge、LC/Q-TOF forensic technology、Solar industry、Bare printed circuit boards manufacturing
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